Multiwire Laboratories, Ltd.

Recent Developments:

 

1. New NorthStar v6 Software is Released with Fault-Tolerant Capability

The new v6 software a) accomodates small variation in film-to-specimen distance, b) controls percentage of Laue spots to be indexed (can now ignore a few troublesome points, if needed), c) tries multiple combinations of starting Laue points and selects the best orientation matrix automatically, and d) has new "speed icons" for faster manual work and new "macro" facility for one-touch analysis of crystal orientation.

Once set with the right condition, Novice users can achieve Expert results with very little effort. Download brochure detailing these advantages here.

2. NorthStar “Misorientation” Routine Produces Good Results on Casting Bi-crystal

The “Misorientation” routine in the Multiwire NorthStar 5.0 software has been successfully used to quickly calculate the composite misorientation angle about three orthogonal axes of two cubic crystalline grains over a misorientation angular range of 0 to 20 degrees with less than 0.5 degree composite error when testing silicon wafers (perfect crystal case) and nickel-based casting parts (less perfect samples).  We illustrate how easy it is to do this with some example images.  Download the 2.3 Mbyte .pdf report of test results for more information.  This software is now in the v6.0 NorthStar software package and is ready to use!

Computer and software upgrades  Older Win 3.1 and Win 95 operating systems can be upgraded, see  MWL110 system upgrade for Win2k (or Vista) and NorthStar version 6.0