Multiwire Laboratories, Ltd.

 

Multiwire Laboratories Ltd. develops and manufactures products for rapid x-ray orientation of single crystals by the Laue back-reflection method. Industrial and academic laboratories utilize the real-time detector, motorized orientation stages, and computer analysis of back-reflection images to characterize or determine the orientation of the lattice planes in a variety of crystal materials such as silicon, gallium arsenide, sapphire, and geological minerals. The same analysis software is now available for indexing Polaroid™ Laue back-reflection photographs as well with the ScanOrient software.  The newly released NorthStar v6.0 software now includes software to automatically collect, find peaks, and index most back-reflection Laue images. "Find extra planes" feature now even shows you the computed plane position oriented behind the collimator that you can't see when perfectly oriented! Version 6 software is the culmination of several years of development work and is a quantum improvement over v5, especially in the area of ease of use. Download brochure detailing these advantages here.

 

Watch video demonstrations of our MWL110 Real-Time System and motorized accessories

 

	The image to the left shows a collected image of a Silicon crystal.
	This image shows the crystal indexed after using the Find HKL Routine in our NorthStar 5.0 software.

MWL400 ScanORIENT™ software indexes Polaroid™ back-reflection Laue images after scanning  with TWAIN compatible image scanner.  ScanORIENT™ software is similar to the NorthStar software described above and also indexes cubic, hexagonal, ... triclinic crystal systems, creates stereographic projections, etc.  Accuracy of the orientation depends on the accuracy of scanner, the quality of spots in image, the film-to-specimen distance, etc. and is typically a fraction of a degree for standard 3 cm film-to-specimen distances.